[English]
Trager-Cowan,
C.;
Alasmari,
A.;
Avis,
W.;
Bruckbauer,
J.;
Edwards,
P. R.;
Hourahine,
B.;
Kraeusel,
S.;
Kusch,
G.;
Jablon,
B. M.;
Johnston,
R.;
Martin,
R. W.;
McDermott,
R.;
Naresh-Kumar,
G.;
Nouf-Allehiani,
M.;
Pascal,
E.;
Thomson,
D.;
Vespucci,
S.;
Mingard,
K.;
Parbrook,
P. J.;
Smith,
M. D.;
Enslin,
J.;
Mehnke,
F.;
Kneissl,
M.;
Kuhn,
C.;
Wernicke,
T.;
Knauer,
A.;
Hagedorn,
S.;
Walde,
S.;
Weyers,
M.;
Coulon,
P-M;
Shields,
P. A.;
Zhang,
Y.;
Jiu,
L.;
Gong,
Y.;
Smith,
R. M.;
Wang,
T.;
Winkelmann,
A.
Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope
,
EMAS 2019 WORKSHOP - 16TH EUROPEAN WORKSHOP ON MODERN DEVELOPMENTS AND APPLICATIONS IN MICROBEAM ANALYSISBand891aus
IOP Conference Series-Materials Science and EngineeringHerausgeber:
IOP PUBLISHING LTD,
DIRAC HOUSE, TEMPLE BACK, BRISTOL BS1 6BE, ENGLAND
2020