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Former PhD students & Postdocs
| Name | Today |
|---|---|
| Debusmann, Ralph | Berliner Glas, Berlin |
| Dinh, Duc | Tyndall National Institute, Cork (Ireland) |
| Drago, Massimo | Osram Opto Semiconductors, Regensburg |
| Ewald, Marcel | |
| Hoffman, Veit | Ferdinand-Braun-Institut, Berlin |
| Jakomin, Roberto | CNRS, Paris (France) |
| Kadir, Abdul | Singapore MIT Alliance for Research & Technology (Singapore) |
| Kaspari, Christian | LayTec AG, Berlin |
| Kremzow, Raimund | SPECS Surface Nano Analysis GmbH, Berlin |
| Meißner, Christian | LayTec AG, Berlin |
| Paßmann, Regina | SPECS Surface Nano Analysis GmbH, Berlin |
| Ploch, Simon | FLEXIM, Flexible Industriemesstechnik GmbH, Berlin |
| Poser, Florian | Otto Bock GmbH, Salt Lake City |
| Pristovsek, Markus | Cambridge University, Cambridge (UK) |
| Riecke, Sina | Spectra-Physics, München |
| Riedle, Thomas | Helmholtz-Zentrum Berlin (HZB) |
| Schmidtling, Torsten | |
| Skruidina, Daria | University of California, Berkeley (USA) |
| Weeke, Stefan | Solibro, Leipzig |
Former diploma- & masterstudents
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| Name | Heute |
|---|---|
| Arlt, Tobias | Helmholtz-Zentrum Berlin (HZB) |
| Bauch, Erik | Harvard University, Cambridge (USA) |
| Biermann, Amelie | TU Berlin |
| Budack, Fabian | Helmholtz-Zentrum Berlin (HZB) |
| Duge, Florian | |
| Falkenburg, Johannes | |
| Fleischmann, Simon | Ferdinand-Braun-Institut (FBH) |
| Guderian, Matthias | Federal Institute for Materials Research & Testing (BAM), Berlin |
| Hoffmann, Marc | North Carolina State University, Raleigh (USA) |
| Högele, Michael | Laser 2000, Berlin |
| Hoppe, Michael | |
| Jeschke, Jörg | Ferdinand-Braun-Institut (FBH) |
| Kropp, Miron | University of Bremen |
| Kruse, André | |
| Kusch, Gunnar | University of Strathclyde, Glasgow (UK) |
| Kuznecov, Igor | Infineon, Dresden |
| Matthesius, Daniel | Jenoptik Polymer Systems, Berlin |
| Myrach, Philipp | Fritz-Haber Institut der May-Planck Gesellschaft, Berlin |
| Oestereich, Andreas | Fritz-Haber Institut der May-Planck Gesellschaft, Berlin |
| Rackwitz, Vanessa | Federal Institute for Material Research & Testing (BAM), Berlin |
| Riele, Linda | Robert Riele GmbH & Co KG, Berlin |
| Rothe, Mark-Antonius | |
| Şavaş, Özgür | ISAS Berlin |
| Schenk, Tobias | LayTec AG, Berlin |
| Schmies, Matthias | |
| Sedlmeier, Katrin | University of Stuttgart |
| Sembdner, Toni | |
| Solopow, Sergeij | Helmholtz-Zentrum Berlin |
| Stascheit, Marcus | |
| Zhao, Bo | Bühler Technologies GmbH |
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